SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly…


MRS Spring 2020

MRS Spring Meeting 2020

We're excited to be attending the MRS Spring Meeting & Exhibit…


IOG-30D Duoplasmatron Ion Beam System
GCIB-40 40kV Gas Cluster Ion Beam System
GCIB-SM 70kV Gas Cluster Ion Beam System
J105 SIMSIonoptika Ltd 2018


Below are a list of selected publications using Ionoptika equipment 2020 The…
C60-40 40kV C60 Ion Beam System
J105 SIMSIonoptika Ltd 2018