ion beams and their applications

Ion Beams and their Applications

Ion beams come in many shapes and sizes; different source technologies…
SIMS showing Cr signal of M1.6 screw thread

ToF SIMS of Rough or Uneven Samples

A common problem faced by TOF SIMS analysis is loss of peak resolution…
3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

Depth profiling is a powerful technique in surface analysis for…
SIMS overlay image of rock surface

ToF-SIMS Analysis on Insulating Samples

Performing ToF-SIMS analysis on insulating samples can be particularly…


GCIB-40 40kV Gas Cluster Ion Beam System
GCIB-SM 70kV Gas Cluster Ion Beam System
GCIB 10S Gas Cluster Ion Beam
J105 SIMSIonoptika Ltd 2018
J105 SIMSIonoptika Ltd 2018