Posts

3D SIMS overlay of a single Tetrahymena cell in water ice on a silicon substrate.

Depth Profiling in ToF-SIMS with the J105 SIMS

/
Depth profiling is a powerful technique in surface analysis for…

Pages

FLIG5 Floating Ion Beam System
GCIB 10S Gas Cluster Ion BeamIonoptika 2020
C60-40 40kV C60 Ion Beam System