The J105 at a glance
With a host of exciting features, the J105 is the ideal tool for a range of applications.
Water Cluster Source
- Water Cluster upgrade for GCIBs.
- Increase secondary ion yield by up to 500x compared with Ar gas.
- Greatly reduced fragmentation and very low surface damage.
- Image low abundance analytes with unprecedented clarity at resolutions down to 1.5 μm
Choice of Ion Beams
- Choose up to 3 different primary ion beams, covering a wide range of applications and budgets.
- The J105’s unique design allows any ion beam to be used without impacting performance.
- Gas cluster ion beams for analysis of biological samples to 1.5 m resolution.
- C60 cluster beam for the best of both worlds – low fragmentation and small spot size.
- Gold cluster beam for very small spot size and elemental analysis.
Specialist Analysis Software
- Analysis built around imaging, with real-time spectral/image scanning.
- Quickly identify patterns within the data, find related peaks, and make tentative assignments.
- Fast image mode – view even large data sets on a laptop.
- Convenient export tools for common data formats such as HDF5 and imzML.
Cryo Sample Handling
- Liquid nitrogen cooling available as standard.
- Maintain temperatures down to 100 K at both main sample stage and the sample insertion lock.
- Full stage mobility even at 100 K for large-area tiled analysis.
- New ultra-low humidity glove box available for air/water sensitive samples.
- Easily integrates into the cryo-workflow for sensitive biological and materials analysis.
- Accommodates samples up to 6 mm in height.
Tandem MS Mode
- For definitive peak assignment, tandem MS mode is included as standard.
- Select the parent ion of interest and fragment it in a high-energy collision cell, producing a characteristic fragment spectrum.
- Combined with consistent high mass accuracy and mass resolution, the J105 provides all the tools to make accurate assignments with confidence.
- The unique buncher-ToF analyser delivers high mass resolution no matter what ion beam is in use.
- High mass accuracy (< 5 ppm) is maintained across all points on a sample, even on very rough samples.
- Transmission is maintained even on highly curved surfaces.
- Gives you confidence in the raw data, making analysis faster and easier.
The GCIB 10S at a glance
Argon clusters are formed by adiabatic expansion of high-pressure gas through a thin nozzle.
Two turbo molecular pumps help keep vacuum levels in the upper column below 5×10-7 mbar.
Neutral clusters are ionised through electron bombardment and accelerated up to 10 keV.
A Wien filter controls the mass of clusters reaching the target.
A gate valve is included for fast, safe venting of the source without exposing the chamber to air.
An NW63CF flange ensures compatibility with a wide range of vacuum chambers.
Electrostatic scan plates and a final focusing lens control the beam on the sample.