We are happy to announce the release of Analyse v220.127.116.11 for all J105 SIMS customers. This long awaited release brings with it a host of new features as well as several bug fixes. Chief among the new features is a new imzML file converter. To download the new release, simply go to our downloads page […]
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Entries by webmaster
This month we move away from new hires to what will be a very familiar face to many of our customers around the world, Senior Test & Service Engineer, Gavyn Trowbridge.
GCIB-SEM is a new technique that combines high resolution electron microscopy with the damage free sputtering of gas cluster ions to produce incredible 3D tomography with less than 10 nm isotropic resolution. Over the last two decades, gas cluster ion beams (GCIB) have become increasingly popular as add-on components for ultra-high vacuum techniques such as […]
C60 cluster ion beams are a fantastic tool for analyzing both hard and soft materials. Composed of sixty carbon atoms arranged into a football shape, C60 ions combine several different features making it a great all-rounder ion beam. This is why we always recommend customers to consider including a C60 beam when specifying their J105. […]
On Thursday, in collaboration with UCVAC, we held a webinar on the GCIB 10S Gas Cluster Ion Beam for potential customers in China. The webinar was a great success, and we will certainly look to use this format again to connect with potential customers around the world, particularly while travel restrictions remain in place. IONOPTIKA […]
This month, continuing the theme of new hires, we introduce Development Engineer, Dr. Michal Ryszka, who joined Ionoptika in 2019.
The J105 SIMS is a state-of-the-art 3D imaging ToF SIMS combining innovative design with cutting-edge science that has redefined ToF SIMS. Designed to exploit the benefits of cluster ion beams, the J105 delivers exceptional sensitivity to molecular ions, 3D MS imaging, and consistent performance across all samples. In this article, we aim to give you […]
The high attrition rate of pharmaceutical drug compounds adds enormously to the cost of those that make it to market, so there is an urgent and growing need to identify failure at earlier stages of drug development. In order to do so, researchers require as much information as possible. Specifically, there is a need to […]
The first to be in the spotlight is one of most recent hires, Dr Naoko Sano, our new Applications Scientist. We asked Naoko about her career and what she enjoys about working at Ionoptika.
Detection of drug compounds and their metabolites in natural environments is a critical topic for both forensic and pharmaceutical applications, and requires overcoming some of the limitations in existing microscopic and analytical techniques. Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a powerful analytical technique capable of providing detailed chemical and spatial information […]