You are here: Home1 / Applications 
Ionoptika Ltd 2020
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/03/Featured-image-1.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-03-02 11:37:122020-03-02 11:37:20High-resolution molecular imaging ToF SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/02/cherry_banner.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-02-28 13:13:472020-02-28 14:12:54Detecting pollutants in a Cherry Blossom leaf
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/03/ion-beams-post-banner_260x185.jpg?fit=906%2C644&ssl=1
644
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-03-01 13:32:572018-03-01 14:42:04Ion Beams and their Applications
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/screwthread_big-1.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 16:14:402018-03-13 16:25:09ToF SIMS of Rough or Uneven Samples
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/depth_post_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 15:38:592018-03-05 13:06:13Depth Profiling in ToF-SIMS with the J105 SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/insulating_rock_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 09:59:362018-03-05 12:40:27ToF-SIMS Analysis on Insulating SamplesIonoptika Ltd 2020
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/03/Featured-image-1.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-03-02 11:37:122020-03-02 11:37:20High-resolution molecular imaging ToF SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/02/cherry_banner.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-02-28 13:13:472020-02-28 14:12:54Detecting pollutants in a Cherry Blossom leaf
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/03/ion-beams-post-banner_260x185.jpg?fit=906%2C644&ssl=1
644
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-03-01 13:32:572018-03-01 14:42:04Ion Beams and their Applications
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/screwthread_big-1.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 16:14:402018-03-13 16:25:09ToF SIMS of Rough or Uneven Samples
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/depth_post_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 15:38:592018-03-05 13:06:13Depth Profiling in ToF-SIMS with the J105 SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/insulating_rock_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 09:59:362018-03-05 12:40:27ToF-SIMS Analysis on Insulating Samples Ionoptika Ltd 2020
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/03/Featured-image-1.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-03-02 11:37:122020-03-02 11:37:20High-resolution molecular imaging ToF SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/02/cherry_banner.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-02-28 13:13:472020-02-28 14:12:54Detecting pollutants in a Cherry Blossom leaf
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/03/ion-beams-post-banner_260x185.jpg?fit=906%2C644&ssl=1
644
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-03-01 13:32:572018-03-01 14:42:04Ion Beams and their Applications
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/screwthread_big-1.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 16:14:402018-03-13 16:25:09ToF SIMS of Rough or Uneven Samples
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/depth_post_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 15:38:592018-03-05 13:06:13Depth Profiling in ToF-SIMS with the J105 SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/insulating_rock_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 09:59:362018-03-05 12:40:27ToF-SIMS Analysis on Insulating Samples
Scroll to top
Ionoptika Ltd 2020
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/03/Featured-image-1.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-03-02 11:37:122020-03-02 11:37:20High-resolution molecular imaging ToF SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2020/02/cherry_banner.jpg?fit=906%2C415&ssl=1
415
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2020-02-28 13:13:472020-02-28 14:12:54Detecting pollutants in a Cherry Blossom leaf
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/03/ion-beams-post-banner_260x185.jpg?fit=906%2C644&ssl=1
644
906
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-03-01 13:32:572018-03-01 14:42:04Ion Beams and their Applications
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/screwthread_big-1.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 16:14:402018-03-13 16:25:09ToF SIMS of Rough or Uneven Samples
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/depth_post_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 15:38:592018-03-05 13:06:13Depth Profiling in ToF-SIMS with the J105 SIMS
https://i0.wp.com/www.ionoptika.com/wp-content/uploads/2018/02/insulating_rock_big.jpg?fit=700%2C321&ssl=1
321
700
webmaster
https://www.ionoptika.com/wp-content/uploads/2018/06/IO_logo_black_700x322.png
webmaster2018-02-06 09:59:362018-03-05 12:40:27ToF-SIMS Analysis on Insulating Samples
