Products

Contact

Product News

Thumbnail Ionoptika recently moved to a new factory which provides a three-fold increase in space for offices and manufacturing. The new factory is located in Chandler’s Ford, near Southampton, in the UK....
Thumbnail   A GCIB-10S cluster ion beam upgrade kit has been integrated to a VG ESCALAB XPS instrument raising its performance in polymer analysis. Installation was completed within a few days with minimal...
Thumbnail Another XPS instrument matched with the Ionoptika GCIB 10S cluster ion beam system. This instrument is an Omicron ESCA Multiprobe upgraded to enhance polymer research. A sample of polyimide (Kapton)...
Thumbnail   Making use of the port normally reserved for the dual anode x-ray source the GCIB-10S fits perfectly on a Kratos Axis Ultra XPS instrument. Data taken with the GCIB-10S used for sputtering PET...
Thumbnail A significant feature of the J105 SIMS is its ability to cope with real samples of varying height. Signal intensity and mass accuracy are maintained across different regions of the sample. A good...
Thumbnail Ionoptika recently completed work on two Gas Cluster Ion Beam systems, the GCIB 10S and the GCIB 20. The GCIB 10S is a high current sputter beam system suitable for ESCA and SIMS applications. The...