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Thumbnail The SED 03 is a channeltron based system for detection of secondary electrons or ions, providing an amplified signal suitable for feeding into an image display system.   System  Secondary electron/ion detector assembly Pre-amplifier Computer controlled power supply and cables     Detector (Key Features) High gain up to 6e7 @ 3kV ensures maximum detection sensitivity Multiplier has exceptional performance with high gain stability and low noise Not sensitive to light as is the case with...
Thumbnail The RSU 2000 is a fully integrated beam scanning control package, designed for use in conjunction with ion or electron beam systems for imaging, micromachining and lithography. It provides scan outputs for connection to an ion-column or electron-column; these scans can be set to a wide range of frame rates and pixel densities via a pc software interface. Designed for simple integration both with Ionoptika systems and with third party equipment, it can drive up to 3 scan outputs simultaneously, with...
Thumbnail The IGM 300 system is a complete imaging system incorporating Ionoptika’s latest design of scan controller, the RSU 2000. Combined with secondary electron/ion detection and a comprehensive control software package this provides a highly flexible integrated imaging package. System Comprises: Secondary electron/ion detector SED power supply Scan controller with integrated frame grabber Scan amplifier Imaging and control software.   Detector The detector can be mounted onto a vacuum chamber via...