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C60 Ion Beam Products

Thumbnail The IOG C60-40 provides a highly focussed C60 cluster ion beam for molecular SIMS analysis. The use of high mass primary ions provides a substantial yield enhancement of intact molecules and large fragments during the analysis of most organic surfaces. The high voltage and demagnifying optics of the C60-40 ion column allow spatial resolution below 0.5 micron. The C60 + primary ion beam is a valuable aid to analysis in biochemistry, polymer science and other fields of complex organic chemistry....
Thumbnail The IOG C60-20 is a high performance tool for SIMS analysis of samples with a high degree of chemical complexity. The use of high mass primary ions provides a substantial yield enhancement of intact molecules and large fragments during the analysis of most organic materials. Sputtering Mechanism The C60 + primary projectile dissipates energy into the top few monolayers of the sample, ejecting intact molecules and large fragments from around the impact site. The low penetration depth of the...
Thumbnail The IOG C60-10 was developed by Ionoptika in co-operation with Ulvac Phi Corporation as a tool for sputter cleaning and depth profiling of samples for XPS and Auger. The use of a C60 (fullerene) ion beam results in rapid etching with very low damage to the underlying sample. The IOG C60-10 represents a major advance for surface analysis. The IOG C60-10 is a fully computer controlled system.   It Comprises C60 ion source and column (including focussing, scan plates, mass filter, alignment and...