Entries by webmaster

What is Ion Implantation?

Ion implantation is a process whereby dopant ions are accelerated in intense electrical fields to penetrate the surface of a material, thus changing the material’s properties. An essential technique in […]

SIMS23 Rowland Hill Awards

The 23rd secondary ion mass spectrometry (SIMS 23) conference was held in Minneapolis, MN, from 18 – 23 September 2022. The biennial event is a forum for colleagues from academic, […]

Ion Beams and their Applications

Ion beams come in many shapes and sizes, with multiple source options and applications. A minefield of options awaits if you are unfamiliar with them. This application note will shed […]

Analyse v2.0.2.15 Release

We are happy to announce the release of Analyse v2.0.2.15 for all J105 SIMS customers. This long awaited release brings with it a host of new features as well as […]