Secondary Electron/Ion Detector |
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SED
02 |
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| The SED 02 is a channeltron based system for detection of secondary electrons or ions, providing an amplified signal suitable for feeding into an image display system. |  |
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The sytem comprises:
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Some examples
of images taken of a 2000 mesh Cu grid with the SED 02 system. |
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Raw Cu grid |
After a
moderate exposure to a gallium ion beam. |
After long exposure
to a gallium ion beam. |
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The SED 02
detector is extremely versatile offering an adjustable length to suit
most chamber port configurations as can the mounting flange. |
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The detector assembly is designed with a small diameter profile enabling the detector to reach into space restricted areas. It mounts via a NW35CF flange with a standard a length = 146mm and max length as required.. The SED 02 also forms part of an integrated imaging system offerred by Ionoptika IGM 300. |
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Please click here to contact us for further information on the SED 02. |
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