Imaging
RSU 2000, SED 02, IGM 300
 
  System:                
           
RSU 2000

Integrated beam scanning control package, designed for use in conjunction with ion or electron beam systems for imaging, micromachining and lithography

SED 02

 

    a channeltron based system for detection of secondary electrons or ions, providing an amplified signal suitable for feeding into an image display system.
 
 
 
  IGM 300      
    A complete imaging system incorporating Ionoptika’s latest design of scan controller, the RSU 2000. Combined with secondary electron/ion detection and a comprehensive control software package this provides a highly flexible integrated imaging package.

 

 

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