C60 Ion Beam System

IOG C60-40
 

 

The IOG C60-40 provides a C60 ion beam with energy up to 120keV (with triple charge) and spot size down to <300nm for SIMS molecular analysis.

IOG C60-40 ion source and column (including focussing, scan plates, mass filter, alignment and gate valve)

 

Computer controlled HV electronics mounted in a 19inch wide x 6U high chassis.

Software control interface IG-SOFT 300

(Windows XP)

Performance:

       

      • Beam energy: 10 to 40keV (30 to 120keV with triple charge beam)
      • Beam current: > 1nA
      • Minimum spotsize: < 0.3um
      • Maximun FOV @ 40kV : 1mm x 1mm
Applications:

 

  • SIMS depth profiling and imaging of polymers
  • SIMS depth profiling and imaging of biological materials


Please click here for a detailed product information sheet

on the IOG-C60-40.