The IOG-C60-20 is a high performance tool for static SIMS analysis of surfaces with a high degree of chemical complexity.

C60 ion source and column (including focussing, scan plates, mass filter, alignment and gate valve)

Computer controlled HV electronics mounted in a 19inch wide x 6U high chassis.

 

• Beam energy: 10 to 20 kV
• Maximum Beam current > 2 nA
• Minimum spotsize < 2 um
• Maximun FOV@20 kV : 1.3 mm x 1.3 mm

Sputter Cleaning of polymer surfaces for XPS
Depth profiling of polymers for XPS
Sputter Cleaning of polymer surfaces for Auger
Depth profiling of polymers for SIMS
Depth profiling/imaging of biological materials

For further notes on C60 applications please click this link

Please click here for a detailed product information sheet on the IOG C60-20.