C60 Ion Beam System

IOG C60-20
 

 

 

The IOG C60-20 is a high performance tool for SIMS analysis of surfaces with a high degree of chemical complexity.

C60 ion source and column (including focussing, scan plates, mass filter, alignment and gate valve)

 

Computer controlled HV electronics mounted in a 19inch wide x 6U high chassis.

Software control interface IG-SOFT 300

(Windows XP)

Performance:

       

      • Beam energy: 10 to 20kV
      • Beam current > 2nA
      • Minimum spotsize <2um
      • Maximun FOV@20kV : 2mm x 2mm
Applications:

 

  • SIMS depth profiling and imaging of polymers
  • SIMS depth profiling and imaging of biological materials


Please click here for a detailed product information sheet on the
IOG C60-20.