GCIB 10S on Omicron ESCA Multiprobe Upgrade
Another XPS instrument matched with the Ionoptika GCIB 10S cluster ion beam system. This instrument is an Omicron ESCA Multiprobe upgraded to enhance polymer research.
A sample of polyimide (Kapton) coated with polystyrene was depth profiled with the GCIB 10S on an Omicron XPS instrument. After sputtering the polystyrene coating through to the polyimide layer and with a total sputter time of 1800 seconds the data presented below reveals the undamaged chemical composition.
Data provided courtesy of Omicron GmbH.
The Ionoptika GCIB 10S cluster ion beam is designed as an upgrade to support many XPS instrument configurations. Several popular XPS instruments have already been successfully upgraded including Kratos, Thermo, Omicron and PerkinElmer. Contact us for an upgrade package for your instrument.